We develop notebooks for analysis of Hardware Commissioning (HWC) tests and events during operation (FPA).
1. RB - Main Dipole Circuit
source: Powering Procedure and Acceptance Criteria for the 13 kA Dipole Circuits, MP3 Procedure, https://edms.cern.ch/document/874713/5.1
2. RQ - Main Quadrupole Circuit
source: Test Procedure and Acceptance Criteria for the 13 kA Quadrupole (RQD-RQF) Circuits, MP3 Procedure, https://edms.cern.ch/document/874714/5.1
3. IT - Inner Triplet Circuits
| Type |
Test |
Current |
Description |
Notebook |
Example report |
| HWC |
PCC.T4 |
~ |
Power Converter Configuration part 2 |
AN_IT_PCCT4 |
- |
| HWC |
PIC2 |
~ |
Powering Interlock Controller check with standby current |
AN_IT_PIC2 |
AN_IT_PIC2 |
| HWC |
PNO.D12 |
10% of I_PNO |
Powering Failure at +10% of nominal current |
AN_IT_PNO.d12 |
- |
| HWC |
PNO.D13 |
10% of I_PNO |
Powering Failure at -10% of nominal current |
AN_IT_PNO.d13 |
- |
| HWC |
PLI3.F6 |
I_PLI3 |
Heater Discharge Request at 2nd intermediate current (Note that I_RTQX1=0A |
AN_IT_PLI3.f6 |
AN_IT_PLI3.f6 |
| HWC |
PNO.D14 |
50% of I_PNO |
Powering Failure at +50% of nominal current during a SPA |
AN_IT_PNO.d14 |
AN_IT_PNO.d14 |
| HWC |
PNO.D15 |
50% of I_PNO |
Powering Failure at -50% of nominal current |
AN_IT_PNO.d15 |
AN_IT_PNO.d15 |
| HWC |
PNO.A9 |
I_PNO+I_DELTA |
Training and plateau at nominal current |
AN_IT_PNO.a9 |
AN_IT_PNO.a9 |
| HWC |
PNO.D16 |
90% of I_PNO |
Powering Failure at +90% of nominal current |
AN_IT_PNO.d16 |
AN_IT_PNO.d16 |
| HWC |
PNO.D17 |
90% of I_PNO |
Powering Failure at -90% of nominal current |
AN_IT_PNO.d17 |
AN_IT_PNO.d17 |
| Operation |
FPA |
I_PNO |
FPA during operation with magnets quenching |
AN_IT_FPA |
AN_IT_FPA |
source: Test Procedure and Acceptance Criteria for the Inner Triplet Circuits in the LHC, MP3 Procedure, https://edms.cern.ch/document/874886/2.1
4. IPQ (Individually Powered Quadrupoles)
- 2MQM
Apertures B1 of 2 magnets are powered in series with one power supply.
Apertures B2 of 2 magnets are powered in series with second power supply.
The return bus is common for both power circuits.
- 2x2MQM
Apertures B1 of 4 magnets are powered in series with one power supply.
Apertures B2 of 4 magnets are powered in series with second power supply.
The return bus is common for both power circuits.

- 2MQML – long version
Apertures B1 of 2 magnets are powered in series with one power supply.
Apertures B2 of 2 magnets are powered in series with second power supply.
The return bus is common for both power circuits.

- 2MQM + 2MQML
Apertures B1 of 2 MQM and 2 MQML are powered in series with one power supply.
Apertures B2 of 2 MQM and 2 MQML are powered in series with second power supply.
The return bus is common for both power circuits.

- 2MQM+2MQMC
Apertures B1 of 2 MQM and 2 MQMC are powered in series with one power supply.
Apertures B2 of 2 MQM and 2 MQMC are powered in series with second power supply.
The return bus is common for both power circuits.

- 2MQY*
Apertures B1 of 2 magnets are powered in series with one power supply.
Apertures B2 of 2 magnets are powered in series with second power supply.
The return bus is common for both power circuits.
Note: * in accordance with layout database 2 MQY means apertures B1 and B2 of the one magnet MQY. type.

- 2x2MQY
Apertures B1 of 4 magnets are powered in series with one power supply.
Apertures B2 of 4 magnets are powered in series with second power supply.
The return bus is common for both power circuits.

5. IPD (Individually Powered Dipoles) - Beam Separation Dipoles D1-D4
- MBX – D1
Single aperture of the magnet powered with one power supply. 
- MBRC – D2 - MBRB – D4
Apertures B1 and B2 of the magnet are powered in series with one power supply. 
- MBRS - D3
Apertures B1 and B2 of the magnet are powered in series with one power supply but series connection done in the DFBA. 
source: Test Procedure and Acceptance Criteria for the Separation Dipoles Circuits, MP3 Procedure, https://edms.cern.ch/document/874885/4.1
5. 600 A Circuits
The 600-A circuits come in one of two main variants:
source: Test Procedure and Acceptance Criteria for the 600 A Circuits, MP3 Procedure, https://edms.cern.ch/document/874716/5.3
6. 80-120 A Circuits
| Type |
Test |
Current |
Description |
Notebook |
Example report |
| Operation |
FPA |
I_PNO |
FPA during operation with magnets quenching |
AN_60A_FPA |
AN_60A_FPA |
7. 60 A Circuits
| Type |
Test |
Current |
Description |
Notebook |
Example report |
| Operation |
FPA |
I_PNO |
FPA during operation with magnets quenching |
AN_80-120A_FPA |
AN_80-120A_FPA |